31.200 : Integrated circuits. Microelectronics 31 : Electronics ICS

BS IEC 61523-1:2023

Delay and power calculation standards Integrated Circuit (IC) Open Library Architecture (OLA)
2/12/2024 - PDF - English - BSI
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€449.00

BS IEC 63055:2023

Format for LSI-Package-Board Interoperable design
11/8/2023 - PDF - English - BSI
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€449.00

IEC 63055:2023

IEC 63055:2023 Format for LSI-Package-Board Interoperable design
10/11/2023 - PDF - English - IEC
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€489.00

IEEE 1241:2023

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
10/6/2023 - PDF - English - IEEE
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€151.00

IEEE 1241:2023

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
10/6/2023 - Paper - English - IEEE
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€188.00

BS EN IEC 62228-3:2019

Integrated circuits. EMC evaluation of transceivers CAN
9/18/2023 - PDF - English - BSI
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€377.00

UNE-EN IEC 62228-3:2019/AC:2023-07

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in August of 2023.)
8/2/2023 - PDF - English - AENOR
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€0.00

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)
7/26/2023 - PDF - English - AENOR
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€65.00

BS EN IEC 61967-8:2023 + Redline

Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions radiated emissions. IC stripline method
6/26/2023 - PDF - English - BSI
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€235.00

BS EN IEC 61967-8:2023

Integrated circuits. Measurement of electromagnetic emissions radiated emissions. IC stripline method
6/15/2023 - PDF - English - BSI
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€180.00

NF EN IEC 61967-8, C96-260-8 (06/2023)

Circuits intégrés - Mesure des émissions électromagnétiques - Partie 8 : mesure des émissions rayonnées - Méthode de la ligne TEM à plaques (stripline) pour circuit intégré
6/1/2023 - Paper - French - AFNOR
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€88.33

BS EN IEC 60747-16-7:2022

Semiconductor devices Microwave integrated circuits. Attenuators
5/25/2023 - PDF - English - BSI
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€331.00

BS EN IEC 60747-16-8:2022

Semiconductor devices Microwave integrated circuits. Limiters
5/25/2023 - PDF - English - BSI
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€293.00

IEC 61967-8:2023

IEC 61967-8:2023 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
5/3/2023 - PDF - English, French - IEC
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€132.00

IEC 61967-8:2023 + Redline

IEC 61967-8:2023 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
5/3/2023 - PDF - English - IEC
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€173.00

NF EN IEC 63287-2, C96-287-2 (05/2023)

Dispositifs à semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilité - Partie 2 : concept de profil de mission
5/1/2023 - Paper - French - AFNOR
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€72.00

PR NF EN IEC 60747-16-9, C96-016-9PR (05/2023)

Dispositifs à semiconducteurs - Partie 16-9 : circuits intégrés hyperfréquences - Déphaseurs
5/1/2023 - Paper - English, French - AFNOR
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€115.50

UNE-EN 160000/A1:1995

GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS (Endorsed by AENOR in November of 1996.)
3/31/2023 - PDF - English - AENOR
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€15.00

PR NF EN IEC 62228-5/A1, C96-228-5/A1PR (02/2023)

Amendement 1 - Circuits intégrés - Evaluation de la CEM des émetteurs-récepteurs - Partie 5 : emetteurs-récepteurs Ethernet
2/1/2023 - Paper - English, French - AFNOR
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€64.50

ANSI/VITA 46.0:2023

VPX Baseline Standard
1/1/2023 - PDF - English - VITA
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€120.00

BS EN IEC 62228-6:2022

Integrated circuit. EMC evaluation of transceivers PSI5
12/20/2022 - PDF - English - BSI
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€348.00

NF EN IEC 62228-6, C96-228-6 (12/2022)

Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 6 : émetteurs-récepteurs PSI5
12/1/2022 - Paper - French - AFNOR
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€153.67

IEC 62228-6:2022

IEC 62228-6:2022 Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
11/8/2022 - PDF - English, French - IEC
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€311.00

UNE-EN IEC 62228-6:2022

Integrated circuit - EMC Evaluation of transceivers - Part 6: PSI5 transceivers (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English - AENOR
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€90.00

IEEE 1500:2022

IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
10/12/2022 - PDF - English - IEEE
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€156.00

IEEE 1500:2022

IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
10/12/2022 - Paper - English - IEEE
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€194.00

BS EN IEC 62228-7:2022

Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
5/11/2022 - PDF - English - BSI
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€348.00

UNE-EN IEC 62228-7:2022

Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers (Endorsed by Asociación Española de Normalización in May of 2022.)
5/1/2022 - PDF - English - AENOR
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€90.00

NF EN IEC 62228-7, C96-228-7 (04/2022)

Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 7 : émetteurs-récepteurs CXPI
4/1/2022 - Paper - French - AFNOR
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€153.67

22/30447599 DC:2022

BS EN 62228-5 Amd.1 Ed.1.0. Integrated circuits. EMC evaluation of transceivers Part 5. Ethernet
3/29/2022 - PDF - English - BSI
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€24.00

IEC 62228-7:2022

IEC 62228-7:2022 Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
2/22/2022 - PDF - English, French - IEC
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€345.00

ANSI/VITA 46.11:2022

System Management on VPX
1/18/2022 - PDF - English - VITA
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€120.00

ANSI/VITA 78.0:2022

SpaceVPX System Standard
1/1/2022 - PDF - English - VITA
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€120.00

JEDEC JESD22-B118A:2021

SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
11/1/2021 - PDF - English - JEDEC
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€66.00

NF EN IEC 63287-1, C96-287-1 (10/2021)

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : Guidelines for LSI reliability qualification
10/1/2021 - Paper - French - AFNOR
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€141.33

UNE-EN IEC 62228-5:2021

Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (Endorsed by Asociación Española de Normalización in July of 2021.)
7/1/2021 - PDF - English - AENOR
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€143.00

JEDEC JESD85A:2021

METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS
7/1/2021 - PDF - English - JEDEC
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€74.00

BS EN IEC 62228-5:2021

Integrated circuits. EMC evaluation of transceivers Ethernet
6/11/2021 - PDF - English - BSI
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€398.00

NF EN IEC 62228-5, C96-228-5 (06/2021)

Integrated circuits - EMC evaluation of transceivers - Part 5 : Ethernet transceivers
6/1/2021 - Paper - French - AFNOR
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€219.33

UNE-EN IEC 61967-4:2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method (Endorsed by Asociación Española de Normalización in June of 2021.)
6/1/2021 - PDF - English - AENOR
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€87.00

BS EN IEC 61967-4:2021

Integrated circuits. Measurement of electromagnetic emissions conducted emissions. 1 O/150 O direct coupling method
5/6/2021 - PDF - English - BSI
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€331.00

IEC 62228-5:2021

IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
4/26/2021 - PDF - English - IEC
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€431.00

IEC 62228-5:2021

IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
4/26/2021 - PDF - English, French - IEC
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€431.00

NF EN IEC 61967-4, C96-260-4 (04/2021)

Integrated circuits - Measurement of electromagnetic emissions - Part 4 : measurement of conducted emissions - 1 omega/150 omega direct coupling method - Circuits intégrés - Mesure des émissions électromagnétiques - Partie 4 : Mesure des émissions conduites - Méthode par couplage direct 1 ohm/150 ohms
4/1/2021 - Paper - French - AFNOR
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€127.67

IEC 61967-4:2021

IEC 61967-4:2021 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
3/16/2021 - PDF - English, French - IEC
Learn More

€311.00

IEC 61967-4:2021 + Redline

IEC 61967-4:2021 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
3/16/2021 - PDF - English - IEC
Learn More

€404.00

21/30433680 DC:2021

BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
2/5/2021 - PDF - English - BSI
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€24.00

UNE-EN IEC 62433-6:2020

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) (Endorsed by Asociación Española de Normalización in January of 2021.)
1/1/2021 - PDF - English - AENOR
Learn More

€98.00

ANSI/VITA 68.2:2021

VPX Standard S-Parameter Definition
1/1/2021 - PDF - English - VITA
Learn More

€30.00

BS EN IEC 62433-6:2020

EMC IC modelling Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Immunity (ICIM-CPI)
11/11/2020 - PDF - English - BSI
Learn More

€348.00

NF EN IEC 62433-6, C96-070-6 (11/2020)

EMC IC modelling - Part 6 : models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) - Modèles de circuits intégrés pour la CEM - Partie 6 : Modèles de circuits intégrés pour la simulation du comportement d'immunité aux impulsions - Modélisation de l'immunité aux impulsions conduite (ICIMCPI)
11/1/2020 - Paper - French - AFNOR
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€170.00

IEC 62433-6:2020

IEC 62433-6:2020 EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
9/22/2020 - PDF - English, French - IEC
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€345.00

NF EN 60747-16-5/A1, C96-016-5/A1 (09/2020)

Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
9/1/2020 - Paper - French - AFNOR
Learn More

€54.67

UNE-EN IEC 62433-1:2019/AC:2020-07

EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in September of 2020.)
9/1/2020 - PDF - English - AENOR
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€0.00

20/30426553 DC:2020

BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
8/28/2020 - PDF - English - BSI
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€24.00

BS EN IEC 62433-1:2019

EMC IC modelling General framework
7/28/2020 - PDF - English - BSI
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€348.00

IEEE 1838:2019

IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
3/13/2020 - PDF - English - IEEE
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€99.00

IEEE 1838:2019

IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
3/13/2020 - Paper - English - IEEE
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€124.00

IEEE 1481:2019

IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - PDF - English - IEEE
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€345.00

IEEE 1481:2019 Redline

IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - PDF - English - IEEE
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€466.00

IEEE 1481:2019

IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - Paper - English - IEEE
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€561.00

BS EN IEC 61967-1:2019 + Redline

Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
2/24/2020 - PDF - English - BSI
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€326.00

ASTM E1855-20

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
2/1/2020 - PDF - English - ASTM
Learn More

€51.00

ASTM E1855-20 + Redline

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
2/1/2020 - PDF - English - ASTM
Learn More

€61.00

IEEE 2401:2019

IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - PDF - English - IEEE
Learn More

€194.00

IEEE 2401:2019 Redline

IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - PDF - English - IEEE
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€271.00

IEEE 2401:2019

IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - Paper - English - IEEE
Learn More

€326.00

ANSI/VITA 46.30-2020

VPX: Higher Data Rate
1/1/2020 - PDF - English - VITA
Learn More

€60.00

VITA 46.31-2020-VDSTU

VPX: Higher Data Rate VPX, Solder Tail
1/1/2020 - PDF - English - VITA
Learn More

€60.00

MIL-STD-883-1:2019 & C1:2021

Environmental Test Methods for Microcircuits Part 1: Test Methods 1000-1999
9/16/2019 - PDF - English - DODNAV
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€40.00

MIL-STD-883-2:2019 & C1:2022

Mechanical Test Methods for Microcircuits Part 2: Test Methods 2000-2999
9/16/2019 - PDF - English - DODNAV
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€40.00

MIL-STD-883-3:2019

Electrical Tests (Digital) for Microcircuits Part 3: Test Methods 3000-3999
9/16/2019 - PDF - English - DODNAV
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€40.00

MIL-STD-883-4:2019

Electrical Tests (Linear) for Microcircuits Part 4: Test Methods 4000-4999
9/16/2019 - PDF - English - DODNAV
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€40.00

MIL-STD-883-5:2019 & CN1:2021

Test Procedures for Microcircuits Part 5: Test Methods 5000-5999
9/16/2019 - PDF - English - DODNAV
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€40.00

IEEE 2416:2019

IEEE Standard for Power Modeling to Enable System-Level Analysis
7/31/2019 - PDF - English - IEEE
Learn More

€79.00

IEEE 2416:2019

IEEE Standard for Power Modeling to Enable System-Level Analysis
7/31/2019 - Paper - English - IEEE
Learn More

€100.00

19/30376552 DC:2019

BS EN 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
6/19/2019 - PDF - English - BSI
Learn More

€24.00

UNE-EN IEC 62433-1:2019

EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English - AENOR
Learn More

€72.00

UNE-EN IEC 62228-3:2019

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English - AENOR
Learn More

€116.00

NF EN IEC 62228-3, C96-228-3 (05/2019)

Integrated circuits - EMC evaluation of transceivers - Part 3 : CAN transceivers - Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3 : Émetteurs-récepteurs CAN
5/1/2019 - Paper - French - AFNOR
Learn More

€183.00

NF EN IEC 62433-1, C96-070-1 (04/2019)

EMC IC modelling - Part 1 : general modelling framework
4/1/2019 - Paper - French - AFNOR
Learn More

€170.00

IEEE 1801:2018

IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
3/29/2019 - Paper - English - IEEE
Learn More

€431.00

IEC 62228-3:2019

IEC 62228-3:2019 Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
3/11/2019 - PDF - English, French - IEC
Learn More

€397.00

IEC 62433-1:2019

IEC 62433-1:2019 EMC IC modelling - Part 1: General modelling framework
3/8/2019 - PDF - English - IEC
Learn More

€345.00

IEC 62433-1:2019

IEC 62433-1:2019 EMC IC modelling - Part 1: General modelling framework
3/8/2019 - PDF - English, French - IEC
Learn More

€345.00

UNE-EN IEC 61967-1:2019

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in March of 2019.)
3/1/2019 - PDF - English - AENOR
Learn More

€71.00

BS EN IEC 61967-1:2019

Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
2/21/2019 - PDF - English - BSI
Learn More

€250.00

NF EN IEC 61967-1, C96-260-1 (02/2019)

Integrated circuits - Measurement of electromagnetic emissions - Part 1 : general conditions and definitions
2/1/2019 - Paper - French - AFNOR
Learn More

€116.33

BS IEC 63011-2:2018

Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect
1/24/2019 - PDF - English - BSI
Learn More

€180.00

BS IEC 63011-1:2018

Integrated circuits. Three dimensional integrated circuits Terminology
1/24/2019 - PDF - English - BSI
Learn More

€180.00

BS IEC 63011-3:2018

Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via
1/24/2019 - PDF - English - BSI
Learn More

€180.00

IEC 61967-1:2018

IEC 61967-1:2018 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
12/12/2018 - PDF - English, French - IEC
Learn More

€219.00

IEC 61967-1:2018 + Redline

IEC 61967-1:2018 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
12/12/2018 - PDF - English - IEC
Learn More

€284.00

DIN EN IEC 62228-1 VDE 0847-28-1:2018-12

Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018), German version EN IEC 62228-1:2018
12/1/2018 - Paper - German - VDE
Learn More

€42.45

IEC 63011-3:2018

IEC 63011-3:2018 Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via
11/28/2018 - PDF - English, French - IEC
Learn More

€92.00

IEC 63011-1:2018

IEC 63011-1:2018 Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology
11/28/2018 - PDF - English, French - IEC
Learn More

€92.00

IEC 63011-2:2018

IEC 63011-2:2018 Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
11/28/2018 - PDF - English, French - IEC
Learn More

€92.00

UNE-EN IEC 62228-1:2018

Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in July of 2018.)
7/1/2018 - PDF - English - AENOR
Learn More

€58.00

BS EN IEC 62228-1:2018

Integrated circuits. EMC evaluation of transceivers General conditions and definitions
6/12/2018 - PDF - English - BSI
Learn More

€151.00

NF EN IEC 62228-1, C96-228-1 (06/2018)

Integrated circuits - EMC evaluation of transceivers - Part 1 : general conditions and definitions
6/1/2018 - Paper - French - AFNOR
Learn More

€88.33

BS EN 60747-16-1:2002+A2:2017

Semiconductor devices Microwave integrated circuits. Amplifiers
4/10/2018 - PDF - English - BSI
Learn More

€377.00

DIN EN 60747-16-3:2018-04

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017), German version EN 60747-16-3:2002 + A1:2009 + A2:2017.
4/1/2018 - PDF - German - DIN
Learn More

€136.82

DIN EN 62435-3 VDE 0884-135-3:2018-02

Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (IEC 47/2430/CD:2017)
2/1/2018 - Paper - German - VDE
Learn More

€18.19

IEEE 1804:2017

IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
1/31/2018 - PDF - English - IEEE
Learn More

€54.00

IEEE 1804:2017

IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
1/31/2018 - Paper - English - IEEE
Learn More

€68.00

IEC 62228-1:2018

IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
1/9/2018 - PDF - English, French - IEC
Learn More

€23.00

IEC 62228-1:2018

IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
1/9/2018 - PDF - English - IEC
Learn More

€23.00

ANSI/VITA 46.9:2018

PMC/XMC Rear I/O Fabric Signal Mapping on 3U and 6U VPX Modules Standard
1/1/2018 - PDF - English - VITA
Learn More

€90.00

BS EN 62433-3:2017

EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions (ICEM-RE)
12/13/2017 - PDF - English - BSI
Learn More

€377.00

DIN EN 62090:2017-12

Product package labels for electronic components using bar code and two- dimensional symbologies (IEC 62090:2017), German version EN 62090:2017.
12/1/2017 - PDF - German - DIN
Learn More

€115.33

BS EN 62433-2:2017

EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions (ICEM-CE)
11/14/2017 - PDF - English - BSI
Learn More

€398.00

DIN EN 61967-1 VDE 0847-21-1:2017-11

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 47A/1022/CD:2017)
11/1/2017 - Paper - German - VDE
Learn More

€29.12

DIN EN 62433-6 VDE 0847-33-6:2017-11

EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
11/1/2017 - Paper - German - VDE
Learn More

€53.63

NF EN 60747-16-4/A2, C96-016-4/A2 (11/2017)

Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
11/1/2017 - Paper - French - AFNOR
Learn More

€54.50

DIN EN 62435-1 VDE 0884-135-1:2017-10

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017), German version EN 62435-1:2017
10/1/2017 - Paper - German - VDE
Learn More

€91.70

DIN EN 62435-2 VDE 0884-135-2:2017-10

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017), German version EN 62435-2:2017
10/1/2017 - Paper - German - VDE
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€65.60

DIN EN 62435-5 VDE 0884-135-5:2017-10

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017), German version EN 62435-5:2017
10/1/2017 - Paper - German - VDE
Learn More

€69.60

DIN EN 62433-2 VDE 0847-33-2:2017-10

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017), German version EN 62433-2:2017
10/1/2017 - Paper - German - VDE
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€192.57

DIN EN 62433-3 VDE 0847-33-3:2017-10

EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017), German version EN 62433-3:2017
10/1/2017 - Paper - German - VDE
Learn More

€169.34

DIN EN 62433-1 VDE 0847-33-1:2017-10

Integrated circuits - EMC IC modelling - Part 1: General modelling framework (IEC 47A/1011/CD:2017)
10/1/2017 - Paper - German - VDE
Learn More

€61.54

DIN EN 62228-2 VDE 0847-28-2:2017-09

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-2:2016), German version EN 62228-2:2017
9/1/2017 - Paper - German - VDE
Learn More

€104.79

UNE-EN 61967-4:2002/AC:2017-07

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
9/1/2017 - PDF - English - AENOR
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€0.00

UNE-EN 62090:2017

Product package labels for electronic components using bar code and two- dimensional symbologies (Endorsed by Asociación Española de Normalización in August of 2017.)
8/1/2017 - PDF - English - AENOR
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€72.00

BS EN 62090:2017

Product package labels for electronic components using bar code and two- dimensional symbologies
7/31/2017 - PDF - English - BSI
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€293.00

IEEE 1149.10:2017

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
7/28/2017 - PDF - English - IEEE
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€99.00

IEEE 1149.10:2017

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
7/28/2017 - Paper - English - IEEE
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€122.00

NF EN 62433-2, C96-070-2 (07/2017)

EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
7/1/2017 - Paper - French - AFNOR
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€211.96

NF EN 62090, C90-530 (07/2017)

Product package labels for electronic components using bar code and two-dimensional symbologies
7/1/2017 - Paper - French - AFNOR
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€116.33

UNE-EN 62433-3:2017

EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (Endorsed by Asociación Española de Normalización in July of 2017.)
7/1/2017 - PDF - English - AENOR
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€124.00

DIN EN 62228-3 VDE 0847-28-3:2017-06

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 47A/1004/CD:2017)
6/1/2017 - Paper - German - VDE
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€57.53

UNE-EN 62433-2:2017

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (Endorsed by Asociación Española de Normalización in June of 2017.)
6/1/2017 - PDF - English - AENOR
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€137.00

DIN EN 62433-4 VDE 0847-33-4:2017-05

EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) (IEC 62433-4:2016), German version EN 62433-4:2016
5/1/2017 - Paper - German - VDE
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€183.01

IEC 62090:2017

IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
4/11/2017 - PDF - English, French - IEC
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€270.00

IEC 62090:2017

IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
4/11/2017 - PDF - English - IEC
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€270.00

UNE-EN 62228-2:2017

Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
3/1/2017 - PDF - English - AENOR
Learn More

€78.00

BS EN 62228-2:2017

Integrated circuits. EMC evaluation of transceivers LIN
2/28/2017 - PDF - English - BSI
Learn More

€331.00

IEC 62433-3:2017

IEC 62433-3:2017 EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
1/27/2017 - PDF - English, French - IEC
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€431.00

IEC 62433-2:2017

IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
1/27/2017 - PDF - English, French - IEC
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€431.00

ANSI/VITA 68.0:2017 + Errata

VPX Compliance Channel Standard
1/1/2017 - PDF - English - VITA
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€30.00

ANSI/VITA 68.1:2017 + Errata

VPX Compliance Channel - Fixed Signal Integrity Budget Standard
1/1/2017 - PDF - English - VITA
Learn More

€60.00

UNE-EN 62433-4:2016

EMC IC modelling - Part 4: Models of Integrated Circuits for RF Immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) (Endorsed by AENOR in December of 2016.)
12/1/2016 - PDF - English - AENOR
Learn More

€140.00

BS EN 62433-4:2016

EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted (ICIM-CI)
11/30/2016 - PDF - English - BSI
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€398.00

IEC 62228-2:2016

IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
11/18/2016 - PDF - English, French - IEC
Learn More

€311.00

DIN EN 62132-1 VDE 0847-22-1:2016-09

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 62132-1:2015), German version EN 62132-1:2016
9/1/2016 - Paper - German - VDE
Learn More

€74.10

IEC 62433-4:2016

IEC 62433-4:2016 EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
5/25/2016 - PDF - English, French - IEC
Learn More

€431.00

NF EN 16602-60-02, L90-200-60-02 (04/2016)

Space product assurance - ASIC and FPGA development
4/1/2016 - Paper - English, French - AFNOR
Learn More

€168.00

UNE-EN 62132-1:2016

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (Endorsed by AENOR in April of 2016.)
4/1/2016 - PDF - English - AENOR
Learn More

€69.00

BS EN 62132-1:2016

Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
3/31/2016 - PDF - English - BSI
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€250.00

IEC 62132-1:2015

IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
10/29/2015 - PDF - English, French - IEC
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€173.00

PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
9/30/2015 - PDF - English - BSI
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€348.00

IEC TR 61967-1-1:2015

IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
8/28/2015 - PDF - English - IEC
Learn More

€397.00

DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
8/1/2015 - Paper - German - VDE
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€81.46

DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
8/1/2015 - Paper - German - VDE
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€69.60

IEEE 1687:2014

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
12/5/2014 - PDF - English - IEEE
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€269.00

IEEE 1687:2014

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
12/5/2014 - Paper - English - IEEE
Learn More

€337.00

PD IEC/TS 61967-3:2014

Integrated circuits. Measurement of electromagnetic emissions radiated emissions. Surface scan method
9/30/2014 - PDF - English - BSI
Learn More

€293.00

PD IEC/TS 62132-9:2014

Integrated circuits. Measurement of electromagnetic immunity radiated immunity. Surface scan method
9/30/2014 - PDF - English - BSI
Learn More

€250.00

IEC TS 61967-3:2014

IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
8/25/2014 - PDF - English, French - IEC
Learn More

€270.00

IEC TS 62132-9:2014

IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
8/21/2014 - PDF - English, French - IEC
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€219.00

14/30310478 DC:2014

BS EN 62433-3. EMC IC modelling. Part 3. Models of Integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
7/17/2014 - PDF - English - BSI
Learn More

€24.00

DIN EN 62215-3 VDE 0847-23-3:2014-04

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013), German version EN 62215-3:2013
4/1/2014 - Paper - German - VDE
Learn More

€84.90

NF EN 60747-16-5, C96-016-5 (02/2014)

Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
2/1/2014 - Paper - French - AFNOR
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€127.67

EIA-944:2013

Surface Mount Ferrite Chip Bead Qualification Specification
12/1/2013 - PDF sécurisé - English - EIA
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€81.90

UNE-EN 62215-3:2013

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (Endorsed by AENOR in November of 2013.)
11/1/2013 - PDF - English - AENOR
Learn More

€74.00

BS EN 62215-3:2013

Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
10/31/2013 - PDF - English - BSI
Learn More

€293.00

DIN 51456:2013-10

Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
10/1/2013 - PDF - German - DIN
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€65.89

IEC 62215-3:2013

IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
7/17/2013 - PDF - English, French - IEC
Learn More

€270.00

DIN EN 62132-8 VDE 0847-22-8:2013-03

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012), German version EN 62132-8:2012
3/1/2013 - Paper - German - VDE
Learn More

€65.60

ANSI/VITA 46.6:2013 (R2018)

Gigabit Ethernet Control Plane on VPX
1/1/2013 - PDF - English - VITA
Learn More

€60.00

UNE-EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)
11/1/2012 - PDF - English - AENOR
Learn More

€68.00

BS EN 62132-8:2012

Integrated circuits. Measurement of electromagnetic immunity radiated immunity. IC stripline method
10/31/2012 - PDF - English - BSI
Learn More

€250.00

IEC 62132-8:2012

IEC 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
7/6/2012 - PDF - English, French - IEC
Learn More

€173.00

NF EN 60747-16-4/A1, C96-016-4/A1 (07/2012)

Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
7/1/2012 - Paper - French - AFNOR
Learn More

€72.00

DIN EN 61967-8 VDE 0847-21-8:2012-04

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011), German version EN 61967-8:2011
4/1/2012 - Paper - German - VDE
Learn More

€61.54

UNE-EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by AENOR in January of 2012.)
1/1/2012 - PDF - English - AENOR
Learn More

€63.00

ANSI/VITA 46.3:2012 (R2018)

Serial RapidIO on VPX Fabric Connector
1/1/2012 - PDF - English - VITA
Learn More

€60.00

ANSI/VITA 46.4:2012 (R2018)

PCIExpress (R) on the VPX Fabric Connector
1/1/2012 - PDF - English - VITA
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€30.00

ANSI/VITA 46.7:2012 (R2018)

Ethernet on VPX Fabric Connector
1/1/2012 - PDF - English - VITA
Learn More

€30.00

BS IEC 60748-11:2000

Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated excluding hybrid
7/31/2011 - PDF - English - BSI
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€250.00

BS IEC 60747-10:1991

Semiconductor devices Generic specification for discrete and integrated circuits
7/31/2011 - PDF - English - BSI
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€293.00

DIN EN 62132-2 VDE 0847-22-2:2011-07

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010), German version EN 62132-2:2011
7/1/2011 - Paper - German - VDE
Learn More

€74.10

UNE-EN 62132-2:2011

Integrated circuits - Measurement of electromagnetic immunity -- Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (Endorsed by AENOR in July of 2011.)
7/1/2011 - PDF - English - AENOR
Learn More

€68.00

BS EN 62132-2:2011

Integrated circuits. Measurement of electromagnetic immunity radiated immunity. TEM cell and wideband method
4/30/2011 - PDF - English - BSI
Learn More

€250.00

PD IEC/TR 62433-2-1:2010

EMC IC modelling Theory of black box for conducted emission
2/28/2011 - PDF - English - BSI
Learn More

€250.00

DIN EN 61967-6 Berichtigung 1:2011-02

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008), German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10, (IEC-Cor. :2010 to IEC 61967-6:2002)
2/1/2011 - PDF - German - DIN
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€0.00

BS EN 61967-6:2002+A1:2008

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Magnetic probe method
12/31/2010 - PDF - English - BSI
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€331.00

DIN EN 62417:2010-12

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010), German version EN 62417:2010
12/1/2010 - PDF - German - DIN
Learn More

€59.63

IEC TR 62433-2-1:2010

IEC TR 62433-2-1:2010 EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
10/5/2010 - PDF - English, French - IEC
Learn More

€219.00

IEC 62132-2:2010

IEC 62132-2:2010 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
3/30/2010 - PDF - English, French - IEC
Learn More

€173.00

ANSI/VITA 46.10:2009 (R2015)

Rear Transition Module for VPX
1/1/2009 - PDF - English - VITA
Learn More

€60.00

DIN EN 61967-6:2008-10

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008), German version EN 61967-6:2002 + A1:2008.
10/1/2008 - PDF - German - DIN
Learn More

€115.33